ICET 2023

ICET 2023 Speakers | 主旨报告

Prof. Hongsheng Chen, Zhejiang University, China
IEEE Fellow
陈红胜 教授,浙江大学,
IEEE Fellow,教育部长江特聘教授,国家杰出青年基金获得者

Dr. Hongsheng Chen is a Chang Jiang Scholar Distinguished Professor in the Electromagnetics Academy at Zhejiang University in Hangzhou, Zhejiang, China. He received the B.S. degree in 2000, and Ph.D. degree in 2005, from Zhejiang University, both in electrical engineering. In 2005, Chen became an Assistant Professor at Zhejiang University; In 2007 an Associate Professor; and in 2011 a Full Professor. In 2014, he was honored with the distinguished "Chang Jiang Scholar" professorship by the Chinese Ministry of Education. He was a Visiting Scientist (2006-2008), and a Visiting Professor (2013-2014) with the Research Laboratory of Electronics at Massachusetts Institute of Technology, USA. He is a Fellow of IEEE. Currently he is the Dean of the College of Information Science and Electronic Engineering, Zhejiang University.
His current research interests are in the areas of metamaterials, antennas, invisibility cloaking, transformation optics, and theoretical and numerical methods of electromagnetics. He is the coauthor of more than 200 international refereed journal papers. His works have been highlighted by many scientific magazines and public media, including Nature, Scientific American, MIT Technology Review, The Guardian, Physorg, and so on. He serves as a regular reviewer of many international journals on electromagnetics, physics, optics, and electrical engineering. He serves on the Topical Editor of Journal of Optics, the Editorial Board of the Nature's Scientific Reports, Progress in Electromagnetics Research, and Journal of Electromagnetic Waves and Applications.
Dr. Chen received the National Excellent Doctoral Dissertation Award in China (2008), the Zhejiang Provincial Outstanding Youth Foundation (2008), the National Youth Top-notch Talent Support Program in China (2012), the New Century Excellent Talents in University of China (2012), the National Science Foundation for Excellent Young Scholars of China (2013), and the National Science Foundation for Distinguished Young Scholars of China (2016). His research work on invisibility cloak was selected in Science Development Report as one of the representative achievements of Chinese Scientists in 2007.

Prof. Yu Wang, Tsinghua University, China
IEEE Fellow
汪玉 教授,清华大学, IEEE Fellow

Speech title: Heterogeneous Acceleration for Multi-DNN workloads: Progress and Trends

Yu Wang, professor, IEEE fellow, chair of the Department of Electronic Engineering of Tsinghua University, dean of Institute for Electronics and Information Technology in Tianjin, and vice dean of School of information science and technology of Tsinghua University. His research interests include the application specific heterogeneous computing, processing-in-memory, intelligent multi-agent system, and power/reliability aware system design methodology. Yu Wang has published more than 90 journals (64 IEEE/ACM journals) and 200 conference papers in the areas of EDA, FPGA, VLSI Design, and Embedded Systems, with the Google citation more than 15,000. He has received four best paper awards and 11 best paper nominations. Yu Wang has been an active volunteer in the design automation, VLSI, and FPGA conferences. He will serve as TPC chair for ASP-DAC 2025. He serves as the editor of important journals in the field such as ACM TODAES and IEEE TCAD and program committee member for leading conferences in the top EDA and FPGA conferences.

Prof. Xiaoqing Wen, Kyushu Institute of Technology, Japan
IEEE Fellow
温晓青 教授,日本九州工业大学, IEEE Fellow

Speech title: LSI Testing: A Core Technology to a Successful Semiconductor Industry

Xiaoqing WEN received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. He was an Assistant Professor with Akita University, Japan, from 1993 to 1997, and a Visiting Researcher with the University of Wisconsin–Madison, USA, from Oct. 1995 to Mar. 1996. He joined SynTest Technologies Inc., USA, in 1998, and served as its Vice President and Chief Technology Officer until 2003. He joined Kyushu Institute of Technology, Japan, in 2003, where he is currently a Professor of the Department of Computer Science and Networks. He founded Dependable Integarted Systems Research Center at Kyushu Institute of Technology in 2013 and served as its Director until 2015. He is a Co-Founder and Co-Chair of Technical Activity Committee on Power-Aware Testing under Test Technology Technical Council (TTTC) of IEEE Computer Society. He is an Associate Editor for IEEE Transactions on Very Large Scale Integration Systems (TVLSI) and Journal of Electronic Testing: Theory and Applications (JETTA). He co-authored and co-edited two popular books, VLSI Test Principles and Architectures: Design for Testability (2006) and Power-Aware Testing and Test Strategies for Low Power Devices (2009). His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Infromation Systmes Society (ISS) of the Institute of Electronics, Information and Communication Engineers (IEICE). He is a Fellow of IEEE for his pionerring work in low capture power test generation, a Senior Member of Information Processing Society of Japan (IPSJ), and a Senior Member of IEICE.

Prof. Jin He, Peking University, China
何进 教授, 北京大学,
北大深圳芯片重点实验室主任, 少年中国芯工程总指挥

Speech title: Over-reviewing of Study Progress on Negative Capacitance Gate all around Field Effect Transistor

Professor He Jin has published more than 600 papers on nanoscale CMOS device physics and modeling, new device structures, circuit modeling, and TCAD. He has led or participated in over 50 projects, including the National 973 Program, 863 Program, NSFC, US SRC, and international collaborations. As the main developer, his international IC industry standard CMOS model BSIM4.3.0 has been widely adopted by the global semiconductor industry, accelerating the world's entry into the era of nanoscale and deep nanoscale chips. The international IC industry standard BSIM-FinFET completed by him has been adopted in the design of high-end intelligent mobile phone chips, greatly improving the quality of life in the information society and profoundly reshaping the development path of the chip industry. He founded the Youth China Chip Project, established the Super China Chip Project, and initiated the Digital China Chip Project. He has been reported by media such as CCTV, China International Radio, ScienceNet, Shenzhen Special Zone Daily, China Daily, and People's Daily Overseas Edition. 何进教授在纳米CMOS器件物理和模型,新器件结构,电路模型和TCAD等方面的研究工作已发表论文600多篇。先后主持或参加了国家973、863、NSFC、美国SRC、国际合作等项目50多项。作为主要研发者完成的国际IC工业标准 CMOS 模型 BSIM4.3.0 被国际半导体工业界广泛采用,加速了国际社会进入纳米和深纳米芯片时代;完成的国际IC工业标准 BSIM-FinFET 被国际高端智能手机芯片设计采用,极大地提升了信息社会生活质量并深刻重塑芯片产业的发展路径。创立少年中国芯工程,建立超级中国芯工程,发起数智中国芯工程。曾被 CCTV, 中国国际广播电台,科学网,深圳特区报,中国日报(China Daily),人民日报海外版等媒体报道。

Prof. Tao Jin, Fuzhou University, China
金涛 教授, 福州大学
IET 会士

Dr Tao Jin, Professor, European Union Marie Curie Research Fellow, who have ever worked in the respectable electrical research groups as Dept. of ECE, Virginia Tech, USA and CAP group in Imperial College London. Dr. Tao Jin's research group is a major multidisciplinary, cross-faculty research initiative designed to meet broader energy challenges and facilitate the transition to a sustainable energy economy. The number of research staff, postdoctor, PhD and master students is about thirty, including international researchers. His recent interests mainly include Renewable resource technology, electrical technologies related to smart grid, measurement technology, signal processing , and etc.

ICET Previous Speakers | 往届嘉宾

Zhihua Wang, Tsinghua University, China
IEEE Fellow

Mohamad Sawan, Westlake University, China
IEEE Fellow

Weida Hu, Shanghai Institute of Technical Physics, CAS

Marjan Popov, Delft University of Technology, the Netherlands
IEEE Fellow

Yuhua Cheng, Peking University, China
IEEE Fellow

Xinzhou Dong, Tsinghua University, China
IEEE Fellow

Tao Li, Xi`an University of Posts & Telecommunications, China

Zhi Ning Chen, National University of Singapore
IEEE Fellow

Vladimir Terzija, Skolkovo Institute of Science and Technology, Russia
IEEE Fellow

Andrea Massa, University of Trento, Italy
IEEE Fellow

Gang Feng, University of Electronic Science and Technology of China

Chonglin Chen, The University of Texas at San Antonio,USA

Weihao Hu, University of Electronic Science and Technology of China

Eiji Oki, Kyoto University, Japan

Zhirun Hu, The University of Manchester, UK

Shiwen Yang, University of Electronic Science and Technology of China