Test and Measurement / 测试与测量

Test and Measurement track will devote to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement, recent developments and future directions.

ICET 2018/TM will take place at Chengdu, China, from May 23-27, 2018. This key electronics event should be a "must attend" on your conference calendar.

Call for Papers Timeline / 征稿时间

  • Paper Submission Deadline: 20 February 2018
    截稿时间:2018年2月20日
  • Notification of Acceptance: 15 March 2018
    录用通知时间:2018年3月15日

Call for Papers / 征稿主题

Track 6: Test and Measurement / 测试与测量

Download the call for papers as pdf >>

Topics

• R&D and manufacture of ICs, MEMS, sensors, actuators, photonics, bioelectronics, etc.
• Material – Process – New Technology Characterizations
• New devices – Memory Cells – Arrays
• DC – Pulsed – RF: measurements techniques and applications
• Design Methods – Verification – Metrology
• Devices and Circuit Modeling – Parameter Extraction
• Matching – Variability • Reliability – Wafer-level / thermal Product Failure Analysis and prediction
• Yield Enhancement – Production Process Control
• Measurements – Statistical Characterization – Probing – Throughput - Analysis – Strategies
• Within-die circuits for process characterization / monitoring
• Design enablement – Characterization and validation of digital and analog libraries

ICET 2018 General Chairs

  • Prof. Li Qiang, UESTC, China
  • Prof. Shum Ping, Nanyang Technological University, Singapore
  • Prof. Anand Krishna Asundi, Nanyang Technological University, Singapore
  • Prof. Zhigong Wang, Nanjing University, China

ICET 2018/ Programmable Logic Chairs

  • TBD
  • TBD